RF-sputtered MoS2 film morphology and the imperfection nucleation model

Surface Review and Letters

Volumn 10, Issue 2-3, 2003, Pages 443-448

  Jakovidis, G ^a   Jamieson, I M ^a   Singh, A ^b  

^a MONASH UNIVERSITY   (Australia)

^b UNIVERSITY OF THE SOUTH PACIFIC   (Fiji)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL ORIENTATION; MORPHOLOGY; NUCLEATION; SEMICONDUCTING GALLIUM ARSENIDE; SPUTTER DEPOSITION; THERMAL EFFECTS;

FILM FORMATION;

THIN FILMS;

GLASS; MOLYBDENUM; SODIUM;

CONFERENCE PAPER; CRYSTALLIZATION; FILM; SCANNING ELECTRON MICROSCOPY; TEMPERATURE; VAPOR;

EID: 0042346227     PISSN: 0218625X     EISSN: None     Source Type: Journal    
DOI: 10.1142/s0218625x03004743     Document Type: Conference Paper

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