Using response times to detect aberrant responses in computerized adaptive testing

Psychometrika

Volumn 68, Issue 2, 2003, Pages 251-265

  Van der Linden, Wim J ^a   Van Krimpen Stoop, Edith M L A ^a  

^a UNIVERSITY OF TWENTE   (Netherlands)

Author keywords

Aberrant response patterns; Computerized adaptive testing; Person misfit; Posterior predictive checks; Residual analysis; Response times

Indexed keywords

EID: 0042332231     PISSN: 00333123     EISSN: None     Source Type: Journal    
DOI: 10.1007/BF02294800     Document Type: Article

References (19)

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