Microstructural characterization of Fe-N thin films

Thin Solid Films

Volumn 411, Issue 2, 2002, Pages 225-228

  Zhan, Q ^a   Yu, R ^a   He, L L ^a   Li, D X ^a  

^a INSTITUTE OF METAL RESEARCH   (China)

Author keywords

Fe N film; HREM; Microstructure

Indexed keywords

CRYSTAL STRUCTURE; ELECTRON DIFFRACTION; HIGH RESOLUTION ELECTRON MICROSCOPY; IRON; MAGNETIC ANISOTROPY; MAGNETIZATION; MAGNETRON SPUTTERING; MICROSTRUCTURE; POLYCRYSTALLINE MATERIALS; TRANSMISSION ELECTRON MICROSCOPY;

GRAIN CLUSTERS; ION-BEAM MILLING; MAGNETIC FLUX DENSITY; SELECTED AREA ELECTRON DIFFRACTION (SAD);

THIN FILMS;

EID: 0042297777     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(02)00289-4     Document Type: Article

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