Study on the structure of Fe16N2 single-crystal films by transmission electron microscopy

Thin Solid Films

Volumn 298, Issue 1-2, 1997, Pages 116-121

  Sun, D C ^a,b   Jiang, E Y ^c   Sun, Duoqing ^d  

^a TSINGHUA UNIVERSITY   (China)

^b Beijing Intl Technol Co oper Ctr   (China)

^c TIANJIN UNIVERSITY   (China)

^d Hebei Agrotechnical Teachers College   (China)

Author keywords

Electron diffraction; Nitrides; Saturation magnetisation; Single crystal films; Structural properties; Fe16N2

Indexed keywords

CRYSTAL SYMMETRY; ELECTRON DIFFRACTION; IRON COMPOUNDS; LATTICE CONSTANTS; MAGNETIZATION; MOSSBAUER SPECTROSCOPY; NITRIDES; SINGLE CRYSTALS; TRANSMISSION ELECTRON MICROSCOPY;

IRON NITRIDES; SATURATION MAGNETIZATION;

METALLIC FILMS;

EID: 0031121455     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(96)09059-1     Document Type: Article

References (36)

1. K.H. Jack, Proc. Roy. Soc. London Ser., A, 208 (1951) 216.
2. K.H. Jack, Proc. Roy. Soc. London Ser., A, 208 (1951) 200.
3. T.K. Kim and M. Takahashi, Appl. Phys. Lett., 20 (1972) 492.
4. K. Nakajima, S. Okamoto and T. Okada, J. Appl. Phys., 65 (1989) 4357.
5. K. Nakajima and S. Okamoto, Appl. Phys. Lett., 56 (1990) 92.
6. K. Nakajima, T. Yamashita, M. Takata and S. Okamoto, J. Appl. Phys., 70 (1991) 6033.
7. M. Komuro, Y. Kozono, M. Hanazono and Y. Sugita, J. Appl. Phys., 67 (1990) 5126.
8. Y. Sugita, K. Mitsuoka, M. Komuro, H. Hoshiya, Y. Kozono and M. Hanazono, J. Appl. Phys., 70 (1991) 5977.
9. C. Ortiz, G. Dumpich and A.H. Morrish, Appl. Phys. Lett., 65 (1994) 2737.
10. M.A. Russak, C.V. Jahnes, E. Klokholm, J.W. Lee, M.E. Re and B.C. Webb, J. Appl. Phys., 70 (1991) 6427.
11. M. Kopcewicz, J. Jagielski, A. Turos and D.L. Williamson, J. Appl. Phys., 71 (1992) 4217.
12. C. Gao, W.D. Doyle and M. Shamsuzzoha, J. Appl. Phys., 73 (1993) 6579.
13. A. Kano, N.S. Kazama, H. Fujimori and T. Takahashi, J. Appl. Phys., 53 (1982) 8332.
14. A. Morisako, K. Takahashi, M. Matsumoto and M. Naoe, J. Appl. Phys., 63 (1988) 3230.
15. X.H. Bao, R.M. Metzger and M. Carbucicchio, J. Appl. Phys., 75 (1994) 5870.
16. M.Q. Huang, W.E. Wallace, S. Simizu, A.T. Pedziwiatr, R.T. Obermyer and S.G. Sankar, J. Appl. Phys., 75 (1994) 6574.
17. J.M.D. Coey, K.O. Donnell, Q.N. Qi, E. Touchais and K.H. Jack, J. Phys. Condens. Matter, 6 (1994) L23.
18. M. Takahashi, H. Shoji, H. Takahashi, T. Wakiyama, M. Kinoshita and W. Ohta, IEEE. Trans. Mag., 29 (1993) 3040; see also J. Appl. Phys., 76 (1994) 6642.
19. M. Takahashi, H. Shoji, H. Takahashi, T. Wakiyama, M. Kinoshita and W. Ohta, IEEE. Trans. Mag., 29 (1993) 3040; see also J. Appl. Phys., 76 (1994) 6642.
20. D.C. Sun, C. Lin and E.Y. Jiang, J. Phys. Condens. Matter, 7 (1995) 3667.
21. C. Gao and M. Shamsuzzoha, J. Magn. Magn. Mater., 146 (1995) 273.
22. J.M.D. Coey, J. Appl. Phys., 76 (1994) 6632.
23. Y. Sugita, H. Takahashi, M. Komuro, K. Mitsuoka and A. Sakuma, J. Appl. Phys., 76 (1994) 6637.
24. S. Matar, Z. Phys., B 87 (1992) 91.
25. A. Sakuma, J. Magn. Magn. Mater., 102 (1991) 127.
26. B.I. Min, Phys. Rev., B 46 (1992) 8232.
27. S. Ishida, K. Kitawatase, S. Fujii and S. Asano, J. Phys. Condens. Matter, 4 (1992) 765.
28. S. Ishida and K. Kitawatase, J. Magn. Magn. Mater., 104 (1992) 1933.
29. Z.Q. Li, J. Phys. Condens. Matter, 5 (1993) 1411.
30. H. Sawada, A. Nogami, T. Matsumiya and T. Oguchi, Phys. Rev., B 50 (1994) 10004.
31. R. Coehoorn, G.H.O. Daalderop and H.J.F. Jansen, Phys. Rev., B 48 (1993) 3830.
32. W.Y. Lai, Q.Q. Zheng and W.Y. Hu, J. Phys. Condens. Matter, 6 (1994) L259.
33. E.Y. Jiang, D.C. Sun, C. Lin, M.B. Tian, H.L. Bai and M.S. Liu, J. Appl. Phys., 78 (1995) 2596.
34. L. Reimer, in D.L. MacAdam (ed.), Transmission Electron Microscopy, Spring-Verlag, Berlin, 1984, p. 421.
35. M. Akai, H. Akai and J. Kanamori, J. Magn. Magn. Mater., 31 (1983) 551.
36. H. Akai, M. Akai, S. Blügel, B. Drittler, H. Ebert, K. Terakura, R. Zeller and P.H. Dederichs, Prog. Theor. Phys. Suppl., 101 (1990) 11.