Triple-axis diffractometry on GaN/Al2O3(001) and A1N/A12O3(001) using a parabolically curved graded multilayer as analyzer

Nuovo Cimento della Societa Italiana di Fisica D - Condensed Matter, Atomic, Molecular and Chemical Physics, Biophysics

Volumn 19, Issue 2-4, 1997, Pages 465-472

  Stommer R ^a   Metzger, T ^a   Schuster, M ^a   Gobel H ^a  

^a SIEMENS AG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0042219171     PISSN: 03926737     EISSN: None     Source Type: Journal    
DOI: 10.1007/BF03041006     Document Type: Article

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