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Volumn 82, Issue 1, 2003, Pages 101-106

Thermal annealing dependence of the structural, optical and electrical properties of selenium-tellerium films

Author keywords

Amorphous material; Chalcogenide; Electrical properties; Electron microscope; Microstructure; Optical properties; Thin films

Indexed keywords

ANNEALING; DIFFERENTIAL THERMAL ANALYSIS; LIGHT ABSORPTION; MICROSTRUCTURE; THERMAL EFFECTS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

EID: 0042131635     PISSN: 02540584     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0254-0584(03)00184-6     Document Type: Article
Times cited : (45)

References (34)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.