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Volumn 82, Issue 1, 2003, Pages 101-106
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Thermal annealing dependence of the structural, optical and electrical properties of selenium-tellerium films
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Author keywords
Amorphous material; Chalcogenide; Electrical properties; Electron microscope; Microstructure; Optical properties; Thin films
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Indexed keywords
ANNEALING;
DIFFERENTIAL THERMAL ANALYSIS;
LIGHT ABSORPTION;
MICROSTRUCTURE;
THERMAL EFFECTS;
TRANSMISSION ELECTRON MICROSCOPY;
X RAY DIFFRACTION;
PHASE CHANGE;
THIN FILMS;
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EID: 0042131635
PISSN: 02540584
EISSN: None
Source Type: Journal
DOI: 10.1016/S0254-0584(03)00184-6 Document Type: Article |
Times cited : (45)
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References (34)
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