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Volumn 171, Issue 3-4, 2001, Pages 231-241

Reversible phase change in BixSe100-x chalcogenide thin films for using as optical recording medium

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; BISMUTH COMPOUNDS; CRYSTAL MICROSTRUCTURE; CRYSTALLIZATION; ELECTRODEPOSITION; LIGHT ABSORPTION; MORPHOLOGY; OPTICAL RECORDING; THIN FILMS;

EID: 0035251939     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(00)00709-1     Document Type: Article
Times cited : (29)

References (27)
  • 17
    • 0342791354 scopus 로고
    • JCPDS- ICDD, 33-214, (U.S.A.) Monogr
    • JCPDS- ICDD, 33-214, Natl. Bur. Stand. (U.S.A.) Monogr. 25 (1981) 1816.
    • (1981) Natl. Bur. Stand. , vol.25 , pp. 1816


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.