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Volumn 79, Issue 4, 2003, Pages 519-526

Microcrystallisation in Si:H: The effect of gas pressure in Ar-diluted SiH4 plasma

Author keywords

Microcrystalline silicon; Raman spectroscopy; RF glow discharge; Transmission electron microscopy

Indexed keywords

CRYSTALLIZATION; DEPOSITION; HYDROGEN; PLASMAS; RAMAN SPECTROSCOPY; SILICON; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0042011375     PISSN: 09270248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0927-0248(03)00102-8     Document Type: Article
Times cited : (10)

References (7)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.