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Volumn 94, Issue 3, 2003, Pages 1647-1653

Defect characterization of ZnBeSe solid solutions by means of positron annihilation and photoluminescence techniques

Author keywords

[No Author keywords available]

Indexed keywords

ALLOYING; DEFECTS; ELECTRON ENERGY LEVELS; PHOTOLUMINESCENCE; POSITRON ANNIHILATION SPECTROSCOPY; SEMICONDUCTOR GROWTH;

EID: 0042011363     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1591993     Document Type: Article
Times cited : (12)

References (42)
  • 6
    • 0002216319 scopus 로고
    • edited by B. Gill and R. L. Aulombard (World Scientific, Singapore)
    • C. Verié, in Semiconductors Heteroepitaxy, edited by B. Gill and R. L. Aulombard (World Scientific, Singapore, 1995), p. 73.
    • (1995) Semiconductors Heteroepitaxy , pp. 73
    • Verié, C.1
  • 22
    • 0042257110 scopus 로고    scopus 로고
    • in Ref. 13, p. 335
    • F. Firszt et al., in Ref. 13, p. 335.
    • Firszt, F.1
  • 27
    • 0027107716 scopus 로고
    • M. Heuken, J. Shöllner, F. E. G. Guimaraes, K. Marquardt, and K. Heime, Appl. Phys. Lett. 60, 1694 (1992); J. Cryst. Growth 117, 336 (1992).
    • (1992) J. Cryst. Growth , vol.117 , pp. 336


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.