Transverse compressive stress effect in Y-Ba-Cu-O coatings on biaxially textured Ni and Ni-W substrates

IEEE Transactions on Applied Superconductivity

Volumn 13, Issue 2 III, 2003, Pages 3530-3533

  Cheggour, N ^a   Ekin, J W ^a   Clickner, C C ^a   Verebelyi, D T ^b   Thieme, C L H ^b   Feenstra, R ^c   Goyal, A ^c   Paranthaman, M ^c  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b AMERICAN SUPERCONDUCTOR CORPORATION   (United States)

^c OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

Coated conductors; Critical current density; Mechanical properties; Microstructure; RABiTS; Strain; Stress; Y Ba Cu O

Indexed keywords

COATINGS; COMPRESSIVE STRESS; CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); ELASTIC MODULI; ELASTICITY; MAGNETIC FIELD EFFECTS; NICKEL; SCANNING ELECTRON MICROSCOPY; STRAIN; TEXTURES; TUNGSTEN; YIELD STRESS;

COATED CONDUCTORS;

YTTRIUM BARIUM COPPER OXIDES;

EID: 0041974603     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/TASC.2003.812390     Document Type: Conference Paper

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