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IEEE Transactions on Applied Superconductivity

Volumn 11, Issue 1 III, 2001, Pages 3389-3392

Transverse stress and fatigue effects in Y-Ba-Cu-O coated IBAD tapes

(9) Ekin, J W a Bray, S L a Cheggour, N a Clickner, C C a Foltyn, S R b Arendt, P N b Polyanskii, A A c Larbalestier, D C c McCowan, C N a

a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY (United States)

b LOS ALAMOS NATIONAL LABORATORY (United States)

c UNIVERSITY OF WISCONSIN MADISON (United States)

Author keywords

Coated conductors; Critical current; Electromechanical; IBAD; Mechanical; Stress; Transverse stress

Indexed keywords

COMPUTER SIMULATION; CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); CRITICAL CURRENTS; FATIGUE OF MATERIALS; ION BEAM ASSISTED DEPOSITION; MAGNETIC FIELDS; MAGNETS; SCANNING ELECTRON MICROSCOPY; STRESSES; SUPERCONDUCTING FILMS; YTTRIUM BARIUM COPPER OXIDES; ZIRCONIA;

COATED CONDUCTORS; TRANSVERSE STRESS;

SUPERCONDUCTING TAPES;

EID: 0035268477 PISSN: 10518223 EISSN: None Source Type: Journal
DOI: 10.1109/77.919790 Document Type: Conference Paper

Times cited : (32)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.