Characterization of surface morphologies at the Al-Pd-Mn fivefold surface

Materials Science and Engineering A

Volumn 294-296, Issue , 2000, Pages 822-825

  Cappello, Giovanni ^a,b   Schmithüsen, Frank ^b   Chevrier, Joël ^a,b   Comin, Fabio ^b   Stierle, Andreas ^b   Formoso, Vincenzo ^b   De Boissieu, Marc ^c   Boudard, Michel ^c   Lograsso, T A ^d   Jenks, Cynthia ^d   Delaney, Dwigth ^d  

^a LABORATOIRE DE CRISTALLOGRAPHIE   (France)

^b EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^c UNIV GRENOBLE ALPES   (France)

^d IOWA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM ALLOYS; ANNEALING; ATOMIC FORCE MICROSCOPY; AUGER ELECTRON SPECTROSCOPY; LOW ENERGY ELECTRON DIFFRACTION; MORPHOLOGY; SPUTTERING; X RAY PHOTOELECTRON SPECTROSCOPY;

SCANNING PROBE MICROSCOPY; X-RAY REFLECTIVITY;

QUASICRYSTALS;

EID: 0041928978     PISSN: 09215093     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-5093(00)01330-7     Document Type: Article

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