3-D analysis of nanomaterials using electron tomography

Microscopy and Microanalysis

Volumn 9, Issue SUPPL. 2, 2003, Pages 4-5

  Midgley, P A ^a   Weyland, M ^a   Dunin Borkowski, R ^a   Laffont, L ^a   Thomas, J M ^a   Yates, T ^a  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0041923777     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/s1431927603440300     Document Type: Conference Paper

References (5)

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2. A.J. Koster et al., J. Phys. Chem. B, 104 (2000) 9368-9370.
3. P.A. Midgley et al., Chem. Comm. 18 (2001) 907.
4. G. Mobus and B.J. Inkson, Applied Physics Letters 79 (9) (2001) 1369.
5. M. Weyland and P.A. Midgley, Microsc. Microanal (2003), in press.