The radiation entrance window of pn junction detectors

Metrologia

Volumn 32, Issue 6, 1995, Pages 491-494

  Hartmann, R ^a   Lechner, P ^a   Struder L ^a   Scholze, F ^a   Ulm, G ^a  

^a MAX PLANCK INSTITUTE   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CHANGE COLLECTION PROBABILITY FUNCTION; ENERGY DISPERSIVE RESPONSE FUNCTION; IMPACT IONIZATION; MONOCHROMATIZED SYNCHROTRON RADIATION; PHOTOCURRENT; PHOTOELECTRIC ABSORPTION; PHOTON ENERGIES; PN JUNCTION DETECTORS; PN JUNCTION ENTRANCE WINDOW; RADIATION ENTRANCE WINDOW;

CHARGE CARRIERS; ELECTRON ABSORPTION; IONIZATION; MATHEMATICAL MODELS; PERFORMANCE; PHOTONS; PROBABILITY; RADIOMETRY; SEMICONDUCTOR DIODES; SEMICONDUCTOR JUNCTIONS; STORAGE RINGS; SYNCHROTRON RADIATION;

SILICON SENSORS;

EID: 0030146528     PISSN: 00261394     EISSN: None     Source Type: Journal    
DOI: 10.1088/0026-1394/32/6/17     Document Type: Conference Paper

References (12)

1. Self-calibration of semiconductor photodiodes in the soft x-ray region
2. Ionization Statistics in Silicon X-Ray Detectors - New Experimental Results
3. Ionization Statistics in Silicon X-Ray Detectors - New Experimental Results
4. Transmission, energy distribution, and SE excitation of fast electrons in thin solid films