Configuration and performance of a local electrode atom probe

Microscopy and Microanalysis

Volumn 9, Issue SUPPL. 2, 2003, Pages 564-565

  Kelly, T F ^a   Gribb, T T ^a   Olson, J D ^a   Oltman, E ^a   Wiener, S A ^a   Lenz, D R ^a   Shepard, J D ^a   Martens, R L ^a   Ulfig, R M ^a   Strennen, E M ^a   Bunton, J H ^a   Strait, D R ^a   Kunicki, T C ^a   Payne, T ^a   Watson, J ^a  

^a Imago Scientific Instruments   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0041922284     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/s1431927603442827     Document Type: Conference Paper

References (2)

1. T. F. Kelly et al., US patent #5,440,124 (1995).
2. T. F. Kelly et al., Ultramicroscopy 62 (1996) 29-42.