Surface characterization of thin film devices and optical elements

Current Science

Volumn 78, Issue 12, 2000, Pages 1528-1531

  Sahoo, N K ^a   Bhattacharyya, D ^a   Thakur, S ^a   Udupa, Dinesh ^a   Shukla, R P ^a   Das, N C ^a   Roy, A P ^a  

^a BHABHA ATOMIC RESEARCH CENTRE   (India)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0041908423     PISSN: 00113891     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (11)

1. Swanepoel, R., J. Phys. E, Sci. Instrum., 1984, 17, 896-903.
2. Tikhonravov, A. V., Trubetskov, M. K., Sullivan, B. T. and Dobrowolski, J. A., Appl. Opt., 1997, 36, 7188-7198.
3. Sahoo, N. K. and Shapiro, A. P., Appl. Opt., 1998, 37, 8043-8056.
4. Temple, P. A., Opt. Eng., 1984, 23, 326-330.
5. Sahoo, N. K. and Apparao, K. V. S. R., Appl. Opt., 1992, 31, 6111-6116.
6. Smith, P. H., Surf. Sci., 1969, 16, 34.
7. Das, N. C., Bhattacharyya, D. and Thakur, S., BARC Report E/013, 1998.
8. Bhattacharyya, D. and Das, N. C., BARC Report E/018, 1998.
9. Chindaudom, P. and Vedam, K., in Physics of Thin Films (ed. Vedam, K.), Academic Press, CA, 1994, vol. IXX, pp. 191-247.
10. Phadnis, S. V, Totlani, M. K. and Bhattacharyya, D., Trans. IMF, 1998, 76, 235-237.
11. Forman, P. F., Proc. SPIE, Interferometry, The Society of Photo-Optical Instrumentation Engineers, 1979, 192, 41.