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Volumn 7, Issue 1, 2001, Pages 1-5

Equations of exposure time and X-ray mask absorber thickness in the LIGA process

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[No Author keywords available]

Indexed keywords


EID: 0041905211     PISSN: 09467076     EISSN: None     Source Type: Journal    
DOI: 10.1007/s005420000062     Document Type: Article
Times cited : (2)

References (7)
  • 1
    • 0022717983 scopus 로고
    • Fabrication of microstructures with high aspect ratios and great structural heights by synchrotron radiation lithography, galvanoforming, and plastic moulding (LIGA process)
    • Becker EW; Ehrfeld W; Hagmann P; Maner A; Munchmeyer D (1986) Fabrication of microstructures with high aspect ratios and great structural heights by synchrotron radiation lithography, galvanoforming, and plastic moulding (LIGA Process). J Microelectron Eng 4: 35-56
    • (1986) J Microelectron Eng , vol.4 , pp. 35-56
    • Becker, E.W.1    Ehrfeld, W.2    Hagmann, P.3    Maner, A.4    Munchmeyer, D.5
  • 3
    • 0031382524 scopus 로고    scopus 로고
    • Calculation and experimental determination of the structure transfer accuracy in deep X-ray lithography
    • Feiertag G; Ehrfeld W; Lehr H; Schmidt A; Schmidt M (1997) Calculation and experimental determination of the structure transfer accuracy in deep X-ray lithography. J Micromech Microeng 7: 323-331
    • (1997) J Micromech Microeng , vol.7 , pp. 323-331
    • Feiertag, G.1    Ehrfeld, W.2    Lehr, H.3    Schmidt, A.4    Schmidt, M.5
  • 4
    • 0002787690 scopus 로고
    • Resolution limits in X-ray lithography
    • Feldman M; Sun J (1992) Resolution limits in X-ray lithography. J Vac Sci Technol B 10(6): 3173-3176
    • (1992) J Vac Sci Technol B , vol.10 , Issue.6 , pp. 3173-3176
    • Feldman, M.1    Sun, J.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.