Uncertainties in CMM measurements, control of ISO specifications

CIRP Annals - Manufacturing Technology

Volumn 52, Issue 1, 2003, Pages 423-426

  Sprauel, J M ^a   Linares, J M ^a   Bachmann, J ^a   Bourdet, P ^b  

^a IUT   (France)

^b UNIVERSITÉ PARIS SACLAY   (France)

Author keywords

Coordinate measuring machine; Statistical; Uncertainty

Indexed keywords

COMPUTER AIDED SOFTWARE ENGINEERING; MAXIMUM LIKELIHOOD ESTIMATION; PROBABILITY; QUALITY CONTROL; SPECIFICATIONS; STATISTICAL METHODS; UNCERTAIN SYSTEMS;

COVARIANCE MATRIX; MEASUREMENT UNCERTAINTIES; STATISTICAL PERTURBATION;

COORDINATE MEASURING MACHINES;

EID: 0041842490     PISSN: 00078506     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0007-8506(07)60616-7     Document Type: Article

References (8)

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4. Schwenke, H., Siebert, B,R.L., Wäldele F., Kunzmann H., 2000, Assessment of Uncertainties in Dimensional Metrology by Monte Carlo Simulation, Annals of the CIRP, 49/1:395-397.
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8. Sprauel J.M., Linares, J.M., Bourdet P., 2001, Contribution of nonlinear optimization to the determination of measurement uncertainties, Proceedings of the 7th CIRP Seminar on Computer-Aided Tolerancing: 285-291.