MBE growth of (1 1 0) refractory metals on a-plane sapphire

Journal of Materials Science: Materials in Electronics

Volumn 14, Issue 9, 2003, Pages 533-539

  Ward, R C C ^a   Grier, E J ^a   Petford Long, A K ^a  

^a UNIVERSITY OF OXFORD   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

MOLECULAR BEAM EPITAXY; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; SAPPHIRE; X RAY ANALYSIS;

SURFACE SYMMETRY;

REFRACTORY METALS;

EID: 0041805653     PISSN: 09574522     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1024585400149     Document Type: Conference Paper

References (21)

1. V. ODERNO, C. DUFOUR, K. DUMESNIL, A. MOUGIN, P. MANGIN and G. MARCHAL, Philos. Mag. Lett. 78 (1998) 419.
2. S. M. DURBIN, J. E. CUNNINGHAM, M. E. MOCHEL and C. P. FLYNN, J. Phys. F: Met. Phys. 11 (1981) L223.
3. J. KWO, E. M. GYORGY, D. B. MCWHAN, M. HONG, F. J. DISALVO, C. VETTIER and J. E. BOWER, Phys. Rev. Lett. 55 (1985) 1402.
4. M. B. SALAMON, S. SINHA, J. J. RHYNE, J. E. CUNNINGHAM, R. W. ERWIN, J. BORCHERS and C. P. FLYNN, ibid. 56 (1986) 259.
5. D. F. MCMORROW, D. JEHAN, P. P. SWADDLING, R. A. COWLEY, R. C. C. WARD, M. R. WELLS and K. N. CLAUSEN, Physica B 192 (1993) 150.
6. P. BODEKER, A. ABROMETI, K. BOHL, P. SONNTAG, N. METOKI and H. ZABEL, Phys. Rev. B 47 (1993) 2353.
7. V. ODERNO, C. DUFOUR, K. DUMESNIL, P. MANGIN and G. MARCHAL, J. Cryst. Growth 165 (1996) 175.
8. M. SAWICKI, G. J. BOWDEN, P. A. J. DE GROOT, B. R. RAINFORD, J.-M. BEAUJOUR, R. C. C. WARD and M. R. WELLS, Phys. Rev. B 62 (2000) 5817.
9. M. HUTH and C. P. FLYNN, Phys. Rev. B 58 (1998) 11526.
10. S. JAREN, E. DU TREMOLET DE LACHEISSERIE, D. GIVORD and C. MEYER, J. Magn. Magn. Mater. 165 (1997) 172.
11. C. P. FLYNN, in M. RUHLE, A. G. EVANS, M. F. ASHBY, J. P. HIRTH (eds), "Metal-Ceramic Interfaces" (Pergamon Press, Oxford, 1990) p. 168.
12. J. MAYER, C. P. FLYNN and M. RUHLE, Ultramicroscopy 33 (1990) 51.
13. A. R. WILDES, J. MAYER and K. THEIS-BROHL, Thin Solid Films 401 (2001) 7.
14. G. GUTEKUNST, J. MAYER and M. RUHLE, Philos. Mag. A 75 (1997) 1329.
15. E. J. GRIER, M. L. JENKINS, A. K. PETFORD-LONG, R. C. C. WARD and M. R. WELLS, Thin Solid Films 358 (2000) 94.
16. W. E. LEE and K. P. D. LAGERLOF, J. Electron. Microsc. 2 (1985) 247.
17. B. V. ESCETE, NL-7500 DW Enschede, Netherlands.
18. G. MOBUS, E. SCHUMANN, G. DEHM and M. RUHLE, Phys. Status Solidi A 150 (1995) 77.
19. A. R. WILDES, R. A. COWLEY, R. C. C. WARD, M. R. WELLS, C. JANSEN, L. WIREEN and J. P. HILL, J. Phys.: Condens. Matter. 10 (1998) L631.
20. R. I. BARABASH, W. DONNER and H. DOSCH, Appl. Phys. Lett. 78 (2001) 443.
21. M. PETRUCCI, C. W. PITT and S. R. REYNOLDS, Appl. Phys. 63 (1988) 900.