Preparation by sol-gel method and characterizations of (Bi4-xLax)Ti3O12 thin films

Materials Transactions

Volumn 44, Issue 7, 2003, Pages 1324-1327

  Shen, Lin ^a   Xiao, Dingquan ^a   Yu, Ping ^a   Zhu, Jianguo ^a   Gao, Daojiang ^a   Yu, Guanglong ^a   Zhang, Wen ^a  

^a SICHUAN UNIVERSITY   (China)

Author keywords

(Bi4 xLax)Ti3O12; Atomic force microscopy (AFM); Ferroelectric thin films; Soft solution processing (SSP); Sol gel processing; X ray diffraction (XRD); X ray photoelectron spectroscopy (XPS)

Indexed keywords

ATOMIC FORCE MICROSCOPY; BISMUTH COMPOUNDS; CHARACTERIZATION; CHEMICAL BONDS; COMPOSITION; CRYSTAL LATTICES; LATTICE CONSTANTS; MORPHOLOGY; SOL-GELS; STOICHIOMETRY; X RAY DIFFRACTION ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY;

BISMUTH NITRATE; FERROELECTRIC THIN FILM; LANTHANUM NITRATE; TETRABUTYL TITANATE;

THIN FILMS;

EID: 0041781683     PISSN: 13459678     EISSN: None     Source Type: Journal    
DOI: 10.2320/matertrans.44.1324     Document Type: Article

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