SCOPUS 정보 검색 플랫폼

Journal of Raman Spectroscopy

Volumn 28, Issue 10, 1997, Pages 825-828

In Situ Raman monitoring of the molecular beam epitaxial growth of gallium nitride

(3) Zahn, Dietrich R T a Schneider, Andreas a Drews, Dietrich a

a CHEMNITZ UNIVERSITY OF TECHNOLOGY (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ENERGY GAP; GALLIUM ARSENIDE; III-V SEMICONDUCTORS; MOLECULAR BEAM EPITAXY; MOLECULAR BEAMS; NITROGEN PLASMA; RAMAN SPECTROSCOPY; SIGNAL TO NOISE RATIO; SILICON COMPOUNDS;

ATOMIC NITROGEN; GROWTH OF GAN; GROWTH PROCESS; MOLECULAR BEAM EPITAXIAL GROWTH; MOLECULAR-BEAM EPITAXY; PHOTON ENERGY; RAMAN MONITORING; RF PLASMA SOURCE; SITU RAMAN; SPECTRA'S;

GALLIUM NITRIDE;

EID: 0041769736 PISSN: 03770486 EISSN: None Source Type: Journal
DOI: 10.1002/(SICI)1097-4555(199710)28:10<825::AID-JRS174>3.0.CO;2-P Document Type: Article

Times cited : (4)

References (13)

1
- 0029388336
- S. N. Mohammand, A. A. Salvador and H. Morkoç, Proc. IEEE 83, 1306 (1995).
- (1995) Proc. IEEE , vol.83 , pp. 1306
- Mohammand, S.N.¹ Salvador, A.A.² Morkoç, H.³

2
- 0029779805
- S. Nakamura, M. Senoh, S. Nagahama, N. Iwasa, T. Yamada, T. Matsushita, H. Kiyoku and Y. Sugimoto, Jpn. J. Appl. Phys. 35, L74 (1996).
- (1996) Jpn. J. Appl. Phys. , vol.35
- Nakamura, S.¹ Senoh, M.² Nagahama, S.³ Iwasa, N.⁴ Yamada, T.⁵ Matsushita, T.⁶ Kiyoku, H.⁷ Sugimoto, Y.⁸

3
- 33646414900
- S. Nakamura, Y. Harada and M. Seno, Appl. Phys. Lett. 58, 2021 (1991).
- (1991) Appl. Phys. Lett. , vol.58 , pp. 2021
- Nakamura, S.¹ Harada, Y.² Seno, M.³

4
- 84929998352
- S. Strite, J. Ruan, Z. Li, A. Salvador, H. Chen, D. J. Smith, W. J. Choyke and H. Morkoç, J. Vac Sci. Technol., B 9, 1924 (1991).
- (1991) J. Vac Sci. Technol., B , vol.9 , pp. 1924
- Strite, S.¹ Ruan, J.² Li, Z.³ Salvador, A.⁴ Chen, H.⁵ Smith, D.J.⁶ Choyke, W.J.⁷ Morkoç, H.⁸

5
- 0028529354
- D. Drews, M. Langer, W. Richter and D. R. T. Zahn, Phys. Status Solidi A 145, 491 (1994).
- (1994) Phys. Status Solidi A , vol.145 , pp. 491
- Drews, D.¹ Langer, M.² Richter, W.³ Zahn, D.R.T.⁴

6
- 0030562487
- D. Drews, A. Schneider, K. Horn and D. R. T. Zahn, J. Cryst. Growth 159, 152 (1996).
- (1996) J. Cryst. Growth , vol.159 , pp. 152
- Drews, D.¹ Schneider, A.² Horn, K.³ Zahn, D.R.T.⁴

7
- 0003973002
- edited by G. Bauer and W. Richter, Springer, Berlin
- G. Bauer and W. Richter, in Optical Characterization of Epitaxial Semiconductor Layers, edited by G. Bauer and W. Richter, pp. 129ff. Springer, Berlin (1996).
- (1996) Optical Characterization of Epitaxial Semiconductor Layers
- Bauer, G.¹ Richter, W.²

8
- 0000589965
- Springer Tracts in Modern Physics, edited by G. Höhler, Springer, Berlin
- W. Richter, in Resonant Raman Scattering in Semiconductors, Springer Tracts in Modern Physics, Vol. 78, edited by G. Höhler, p. 121. Springer, Berlin (1976).
- (1976) Resonant Raman Scattering in Semiconductors , vol.78 , pp. 121
- Richter, W.¹

9
- 0028443863
- V. Wagner, D. Drews, N. Esser, D. R. T. Zahn and W. Richter, J. Appl. Phys. 75, 7330 (1994).
- (1994) J. Appl. Phys. , vol.75 , pp. 7330
- Wagner, V.¹ Drews, D.² Esser, N.³ Zahn, D.R.T.⁴ Richter, W.⁵

10
- 21544461610
- H. Morkoç, S. Strite, G. B. Gao, M. E. Lin, B. Sverdlov and M. Burns, J. Appl. Phys. 76, 1363 (1994).
- (1994) J. Appl. Phys. , vol.76 , pp. 1363
- Morkoç, H.¹ Strite, S.² Gao, G.B.³ Lin E, M.⁴ Sverdlov, B.⁵ Burns, M.⁶

11
- 85152996197
- edited by J. H. Edgar, INSPEC, IEE, London
- J. A. Miragliotta, in Properties of Group III Nitrides, edited by J. H. Edgar, p. 191. INSPEC, IEE, London (1994).
- (1994) Properties of Group III Nitrides , pp. 191
- Miragliotta, J.A.¹

12
- 0029481927
- H. Siegle, L. Eckey, A. Hoffmann, C. Thomson, B. K. Meyer, D. Schikora, M. Hankeln and K. Lischka, Solid State Commun. 96, 943 (1995).
- (1995) Solid State Commun. , vol.96 , pp. 943
- Siegle, H.¹ Eckey, L.² Hoffmann, A.³ Thomson, C.⁴ Meyer, B.K.⁵ Schikora, D.⁶ Hankeln, M.⁷ Lischka, K.⁸

13
- 85153005130
- to be published
- D. Drews, A. Schneider and D. R. T. Zahn, to be published.
- Drews, D.¹ Schneider, A.² Zahn, D.R.T.³

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.