Direct measurement of attachment of 220Rn progeny on aerosols by atomic force microscopy

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 508, Issue 3, 2003, Pages 512-518

  Leung, J K C ^a   Tso, M Y W ^a   Lam, J H C ^a   Zhau, Q F ^b  

^a UNIVERSITY OF HONG KONG   (Hong Kong)

^b BEIJING HOSPITAL   (China)

Author keywords

Aerosol attachment; Atomic force microscopy; CR 39; Radon and thoron progeny

Indexed keywords

AEROSOLS; ATOMIC FORCE MICROSCOPY; ETCHING; PARTICLE SIZE ANALYSIS; SCANNING;

NUCLEAR TRACKS;

RADON;

EID: 0041743943     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(03)01473-6     Document Type: Article

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