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Volumn 64, Issue 9-10, 2003, Pages 1825-1829

Schottky properties of CuInSe2 single crystals grown by the horizontal Bridgman method with controlling Se vapor pressure

Author keywords

CuInSe2; Defect physics; Etching; Hall effect; Schottky barrier

Indexed keywords

CAPACITANCE; COPPER COMPOUNDS; CRYSTAL DEFECTS; ELECTRIC CONDUCTIVITY; HALL EFFECT; SCHOTTKY BARRIER DIODES; SEMICONDUCTOR DEVICE MANUFACTURE;

EID: 0041736483     PISSN: 00223697     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-3697(03)00247-6     Document Type: Conference Paper
Times cited : (8)

References (11)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.