A high precision method for measuring very small capacitance changes

Review of Scientific Instruments

Volumn 70, Issue 8, 1999, Pages 3483-3487

  Ashrafi, Ashkan ^a   Golnabi, Hossein ^a  

^a SHARIF UNIVERSITY OF TECHNOLOGY   (Iran)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0041733048     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1149941     Document Type: Article

References (16)

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