Wavelet-based image restoration for compact X-ray microscopy

Journal of Microscopy

Volumn 211, Issue 2, 2003, Pages 154-160

  Stollberg, Heide ^a   Boutet De Monvel, J ^b   Holmberg, A ^a   Hertz, H M ^a  

^a ROYAL INSTITUTE OF TECHNOLOGY   (Sweden)

^b KAROLINSKA INSTITUTE   (Sweden)

Author keywords

Compact X ray microscopy; Image restoration; Wavelet denoising

Indexed keywords

DISCRETE WAVELET TRANSFORMS; IMAGE ENHANCEMENT; RESTORATION; SIGNAL TO NOISE RATIO; X RAY MICROSCOPES;

COMPACT X-RAY MICROSCOPY; DE-NOISING; DISCRETE-WAVELET-TRANSFORM; EXPOSURE-TIME; POWER; WATER WINDOW; WAVELET DENOISING; WAVELET-BASED IMAGES; X RAY MICROSCOPY; X-RAY OPTICS;

IMAGE RECONSTRUCTION;

ARTICLE; IMAGING; MEASUREMENT; MICROSCOPY; OPTICS; PHOTON; PRIORITY JOURNAL; ROENTGEN MICROSCOPY; SIGNAL NOISE RATIO; X RAY ANALYSIS;

EID: 0041657675     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1046/j.1365-2818.2003.01211.x     Document Type: Article

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