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5
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0035800532
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and references therein
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See for example: Ricard, D.; L'Her, M.; Richard, P.; Boitrel, B. Chem. Eur. J. 2001, 7, 3291 and references therein.
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6
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0037388090
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and references therein
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Ching-Long, N.2
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12
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0041798030
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-
note
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(a) See Supporting Information for further details.
-
-
-
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13
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0041297553
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-
note
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(b) Electron hopping, which is responsible for fast charge propagation through films of pure 1 at the electrode surface, is not likely to operate in the 1/Nafion films utilized in the present work, due to high dilution of 1 by Nafion (<1% mol 1).
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-
-
-
14
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-
85086950335
-
-
note
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2, or both as the fraction of such impurities in reduced states increases.
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-
-
-
15
-
-
85086949010
-
-
note
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2 reduction by 1.
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-
-
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16
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0037317380
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Shiryaeva, I. M.; Collman, J. P.; Boulatov, R.; Sunderland, C. J. Anal. Chem. 2003, 75, 494.
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Sunderland, C.J.4
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17
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0000883467
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Murray, R. W., Ed.; Wiley: New York
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Andrieux, C. P.; Saveant, J.-M. In Molecular Design of Electrode Surfaces: Murray, R. W., Ed.; Wiley: New York, 1992; pp 207-270.
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Molecular Design of Electrode Surfaces
, pp. 207-270
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Andrieux, C.P.1
Saveant, J.-M.2
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18
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0042299256
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note
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t is readily available.
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