Bias voltage dependence of apparent local barrier height at constant tip-sample separation

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

Volumn 21, Issue 4, 2003, Pages 1294-1297

  Yagyu, Shinjiro ^a   Yoshitake, Michiko ^a  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ARGON; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC CURRENTS; ELECTRIC POTENTIAL; EVAPORATION; ION BOMBARDMENT; MICA; NUMERICAL METHODS; SCANNING TUNNELING MICROSCOPY; SURFACES; ULTRAHIGH VACUUM; VOLTAGE MEASUREMENT;

BIAS VOLTAGE; LOCAL BARRIER HEIGHT; TIP SAMPLE SEPARATION;

GOLD;

EID: 0041528529     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.1563622     Document Type: Article

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