TEM structural characterization of Sn-Te-O thin films on monocrystalline silicon wafers

Thin Solid Films

Volumn 441, Issue 1-2, 2003, Pages 25-31

  Popova, L I ^a   Peneva, S K ^b   Dimitriadis, C A ^c   Gueorguiev, V K ^a   Andreev, S K ^a  

^a INSTITUTE OF SOLID STATE PHYSICS   (Bulgaria)

^b UNIVERSITY OF SOFIA   (Bulgaria)

^c ARISTOTLE UNIVERSITY OF THESSALONIKI   (Greece)

Author keywords

Heterostructures; Tellurium; TEM; Tin

Indexed keywords

AMORPHOUS FILMS; COMPOSITION; CRYSTALLINE MATERIALS; EVAPORATION; HETEROJUNCTIONS; MICROSTRUCTURE; MULTILAYERS; SILICON WAFERS; TERNARY SYSTEMS; TIN ALLOYS; TRANSMISSION ELECTRON MICROSCOPY;

STRUCTURAL CHARACTERIZATION;

THIN FILMS;

EID: 0041508312     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(03)00888-5     Document Type: Article

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