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1
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0009538385
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Construction, calibration, and testing of a four-detector photopolarimeter
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R. M. A. Azzam, E. Masetti, I. M. Elminyawi, and F. B. Grosz, “Construction, calibration, and testing of a four-detector photopolarimeter,” Rev. Sci. Instrum. 59, 84-88 (1988).
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Azzam, R.M.A.1
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2
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84950615488
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Division-of-amplitude photopolarimeter (DOAP) for the simultaneous measurement of all four Stokes parameters of light
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R. M. A. Azzam, “Division-of-amplitude photopolarimeter (DOAP) for the simultaneous measurement of all four Stokes parameters of light,” Opt. Acta 29, 685-689 (1982).
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Opt. Acta
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Azzam, R.M.A.1
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3
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33646365182
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Calibration, properties, and applications of the division-of-amplitude photopolarimeter at 632.8 and 1523 nm
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S. Krishnan, “Calibration, properties, and applications of the division-of-amplitude photopolarimeter at 632.8 and 1523 nm,” J. Opt. Soc. Am. A 9, 1615-1622 (1992).
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Krishnan, S.1
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Static Stokes ellipsometer: General analysis and optimization
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K. Brudzewski, “Static Stokes ellipsometer: general analysis and optimization,” J. Mod. Opt. 38, 889-896 (1991).
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Brudzewski, K.1
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5
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Determination of the ellipsometric characteristics of optical surfaces using nanosecond laser pulses
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E. Collett, “Determination of the ellipsometric characteristics of optical surfaces using nanosecond laser pulses,” Surf. Sci. 96, 156-167 (1980).
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Collett, E.1
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6
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0005048874
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Division-of-amplitude photopolarimeter based on conical diffraction of light from a metallic grating
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R. M. A. Azzam, “Division-of-amplitude photopolarimeter based on conical diffraction of light from a metallic grating,” Appl. Opt. 31, 3574-3576 (1992).
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Azzam, R.M.A.1
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7
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0027608082
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Photopolarimeter based on planar grating diffraction
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R. M. A. Azzam and K. A. Giardina, “Photopolarimeter based on planar grating diffraction,” J. Opt. Soc. Am. A 10, 1190 -1196 (1993).
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Azzam, R.M.A.1
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9
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0005011015
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Sixteen-beam grating-based division-of-amplitude photopolarimeter
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Y. Cui and R. M. A. Azzam, “Sixteen-beam grating-based division-of-amplitude photopolarimeter,” Opt. Lett. 21, 89-91 (1996).
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Cui, Y.1
Azzam, R.M.A.2
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10
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0028477428
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Mueller-matrix ellipsometry using the division of amplitude photopolarimeter: A study of depolarization effects
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S. Krishnan and P. C. Nordine, “Mueller-matrix ellipsometry using the division of amplitude photopolarimeter: A study of depolarization effects,” Appl. Opt. 33, 4184-4192 (1994).
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Krishnan, S.1
Nordine, P.C.2
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11
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85010115291
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Fast ellipsometry and Mueller-matrix ellipsometry using the division-of-amplitude photopolarimeter
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T. Yoshizawa and H. Yokota, eds., Proc. SPIE 2873
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S. Krishnan and P. C. Nordine, “Fast ellipsometry and Mueller-matrix ellipsometry using the division-of-amplitude photopolarimeter,” in Polarization Analysis and Applications to Device Technology, T. Yoshizawa and H. Yokota, eds., Proc. SPIE 2873, 152-156 (1996).
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Krishnan, S.1
Nordine, P.C.2
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12
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0005284251
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Mueller-matrix ellipsometry on electroformed, rough surfaces
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S. Krishnan, “Mueller-matrix ellipsometry on electroformed, rough surfaces,” J. Mod. Opt. 42, 1695-1706 (1995).
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Krishnan, S.1
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13
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84969555079
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Accurate calibration of the four-detector photopolarimeter with imperfect polarizing optical elements
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R. M. A. Azzam and A. G. Lopez, “Accurate calibration of the four-detector photopolarimeter with imperfect polarizing optical elements,” J. Opt. Soc. Am. A 6, 1513-1521 (1989).
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Azzam, R.M.A.1
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14
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0041362190
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Grating anomalies as local phenomenon
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See, e.g., C. H. Palmer and F. W. Phelps, “Grating anomalies as local phenomenon,” J. Opt. Soc. Am. 58, 1184-1188 (1968).
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See, E.G.1
Palmer, C.H.2
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15
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0005240788
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Instrument matrix of the four-detector photopolarimeter: Physical meaning of its rows and columns and constraints on its elements
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R. M. A. Azzam, “Instrument matrix of the four-detector photopolarimeter: physical meaning of its rows and columns and constraints on its elements,” J. Opt. Soc. Am. A 7, 87-91 (1990).
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Azzam, R.M.A.1
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