Fast ellipsometry and Mueller-matrix ellipsometry using the division-of-amplitude photopolarimeter

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 2873, Issue , 1996, Pages 152-156

  Krishnan, Shankar ^a   Nordine, Paul C ^a  

^a Containerless Research Inc ^*  (United States)

Author keywords

[No Author keywords available]

Indexed keywords

LIQUID CRYSTALS; MATRIX ALGEBRA; POLARIZATION;

DIVISION-OF-AMPLITUDE PHOTOPOLARIMETER; LIQUID CRYSTAL PHASE; MUELLER MATRIX ELLIPSOMETRY; POLARIZATION STATE; PULSE-HEATING; QUARTER WAVES;

ELLIPSOMETRY;

EID: 85010115291     PISSN: 0277786X     EISSN: 1996756X     Source Type: Conference Proceeding    
DOI: 10.1117/12.246205     Document Type: Conference Paper

References (4)

1. Azzam, R. M. A., "Arrangement of four photodetectors for measuring the state of polarization, " Opt. Lett. 10, 309-311, 1985.
2. Krishnan, S., "Calibration, properties, and applications of the division-of-amplitude photopolarimeter at 632.8 and 1523 nm, " J. Opt. Soc. Am. A. 9, 1615-1622 (1992)..
3. S. Krishnan and P. C. Nordine "Mueller-matrix ellipsometry using the Division-of-Amplitude Photopolarimeter: a study of depolarization effects", 33, Appl. Opt, 4184-4192 (1994).
4. S. Krishnan, "Mueller-matrix ellipsometry on electroformed rough surfaces", J. Mod. Opt., 42, 1695-1706 (1995).