Radiation-induced defect formation in chalcogenide glasses

Journal of Non-Crystalline Solids

Volumn 326-327, Issue , 2003, Pages 268-272

  Shpotyuk, O I ^a,b   Filipecki, J ^a   Kozdras, A ^c   Kavetskyy, T S ^b  

^a CZESTOCHOWA UNIVERSITY OF TECHNOLOGY   (Poland)

^b SCIENTIFIC RESEARCH COMPANY CARAT   (Ukraine)

^c OPOLE UNIVERSITY OF TECHNOLOGY   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

POSITRON ANNIHILATION SPECTROSCOPY; POSITRONS; RADIATION EFFECTS; STOICHIOMETRY;

DEFECT FORMATION;

GLASS;

EID: 0041381328     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-3093(03)00406-X     Document Type: Conference Paper

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