Measurement of the noise components in the medical X-ray intensity pattern due to overlaying, nonrecognizable structures

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5030 I, Issue , 2003, Pages 422-432

  Tischenko, Oleg ^a   Hoeschen, Christoph ^a,c   Effenberger, Olaf ^a   Reissberg, Steffen ^a   Buhr, Egbert ^b   Döhring, Wilfried ^a  

^a UNIVERSITY HOSPITAL MAGDEBURG   (Germany)

^b Section for Image Analysis   (Germany)

^c NONE   (Germany)

Author keywords

Anatomical noise; Cross correlation matching; Rotation; Structural noise; Threshold; Two images; Wavelets

Indexed keywords

IMAGE PROCESSING; IMAGE QUALITY; SPURIOUS SIGNAL NOISE; X RAY RADIOGRAPHY;

CROSS-CORRELATION MATCHING;

DIAGNOSTIC RADIOGRAPHY;

EID: 0041374380     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.480007     Document Type: Conference Paper

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