Determination of the X-ray intensity pattern in mammography with very high-spatial resolution

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3977, Issue , 2000, Pages 220-230

  Hoeschen, Christoph ^a   Fessel, Andreas ^a   Buhr, Egbert ^a   Doehring, Wilfried ^a  

^a OTTO VON GUERICKE UNIVERSITY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DETECTORS; MEDICAL IMAGING; X RAY RADIOGRAPHY;

SIGNAL FREQUENCY LIMITS; X RAY INTENSITY PATTERNS;

MAMMOGRAPHY;

EID: 0033731738     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.384496     Document Type: Conference Paper

References (13)