Measurement of nanosize etched pits in SiO2 optical fiber conduit using AFM

Radiation Measurements

Volumn 36, Issue 1-6 SPEC., 2003, Pages 175-178

  Espinosa, G ^a   Golzarri, J I ^a   Vazquez C ^b   Fragoso, R ^b  

^a UNIVERSIDAD NACIONAL AUTÓNOMA DE MÉXICO   (Mexico)

^b DEPARTAMENTO DE FÍSICA   (Mexico)

Author keywords

AFM; Fission fragments; Optical fiber

Indexed keywords

ATOMIC FORCE MICROSCOPY; ETCHING; FISSION REACTIONS; HYDROFLUORIC ACID; SILICA;

SURFACE MATERIALS;

OPTICAL FIBERS;

EID: 0041363185     PISSN: 13504487     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1350-4487(03)00118-5     Document Type: Conference Paper

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