Nanoscale femtosecond spectroscopy for material science and nanotechnology

Synthetic Metals

Volumn 139, Issue 3, 2003, Pages 687-690

  Loi, Maria Antonietta ^a   Da Como, Enrico ^a   Zamboni, Roberto ^a   Muccini, Michele ^a  

^a CNR   (Italy)

Author keywords

Confocal microscopy; Nanoscale ultrafast spectroscopy; Nanotechnology; Two photon excitation microscopy

Indexed keywords

DATA ACQUISITION; LASER BEAM EFFECTS; PERTURBATION TECHNIQUES; PHOTOLUMINESCENCE; SEMICONDUCTOR DEVICE MANUFACTURE; ULTRAFAST PHENOMENA;

CONFOCAL MICROSCOPY;

NANOTECHNOLOGY;

EID: 0041327972     PISSN: 03796779     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0379-6779(03)00265-0     Document Type: Conference Paper

References (14)

1. Koberling F., Mews A., Philipp G., Kolb U., Potapova I., Burghard M., Baschè T. Appl. Phys. Lett. 81:2002;1116.
2. Gronheid R., Hofkens J., Koehn F., Weil T., Reuther E., Muellen K., De Schryver F.C. J. Am. Chem. Soc. 124:2002;2418.
3. Pohl D.W., Fischer U.Ch., During U.T. J. Microsc. 152:1988;853.
4. Zenhausern F., Martin Y., Wickramasinghe H.K. Science. 269:1995;1083.
5. McNeill J.D., O'Connor D.B., Barbara P.F. J. Chem. Phys. 112:2000;7811.
6. T. Wilson, Confocal Microscopy, Academic Press, London, 1990.
7. Schrader M., Hell S.W., van der Voort H.T.M. Appl. Phys. Lett. 69:1996;3644.
8. Denk W., Strickler J.H., Webb W.W. Science. 248:1990;73.
9. Maiti S., Shear J.B., Williams R.M., Zipfel W.R., Webb W.W. Science. 275:1997;530.
10. Shaheen S.E., Brabec C.J., Sariciftci N.S., Padinger F., Fromherz T., Hummelen J.C. Appl. Phys. Lett. 78:2001;841.
11. Muccini M., Murgia M., Biscarini F., Taliani C. Adv. Mater. 13:2001;335.
12. Cumpston B.H., Ananthavel S.P., Barlow S., Dyer D.L., Ehrlich J.E., Erskine L.L., Heikal A.A., Kuebler S.M., Lee I.-Y.S., McCord-Maughon D., Quin J., Roeckel H., Ruml M., Wu X.-L., Marder S.R., Perry J.W. Nature Optics Letters. 398:1999;51.
13. J. Serbin, A. Egbert, A. Ostendorf, B.N. Chichkov, R. Houbertz, G. Domann, J. Schulz, C. Cronauer, L. Froehlich, M. Popall 28 (2003) 301.
14. Nakamura O. Microsc. Res. Tech. 47:1999;165.