Statistical considerations in microanalysis by energy-dispersive spectrometry

Microscopy and Microanalysis

Volumn 4, Issue 6, 1998, Pages 598-604

  Lifshin, Eric ^a   Doganaksoy, Necip ^a   Sirois, Jane ^b   Gauvin, Raynald ^c  

^a GE GLOBAL RESEARCH   (United States)

^b CANADIAN CONSERVATION INSTITUTE   (Canada)

^c UNIVERSITÉ DE SHERBROOKE   (Canada)

Author keywords

Accuracy; Energy dispersive X ray spectrometry (EDS); Precision; Quantitative analysis; Trace analysis; X ray counting statistics; X ray spectral modeling

Indexed keywords

EID: 0032237855     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/S1431927698980576     Document Type: Article

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