High-resolution quantitative x-ray microanalysis of Nb/Al multilayer thin films using the ζ-factor approach

Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties

Volumn 79, Issue 6, 1999, Pages 1423-1442

  Lucadamo, G ^a   Watanabe, M ^a   Barmak, K ^a   Williams, D B ^a   Michaelsen, C ^b   Alani, R ^c  

^a Lehigh University   (United States)

^b INSTITUTE OF MATERIALS RESEARCH   (Germany)

^c GATAN INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0040886237     PISSN: 01418610     EISSN: None     Source Type: Journal    
DOI: 10.1080/01418619908210370     Document Type: Article

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