Detection of hot electron current with scanning hot electron microscopy

Applied Physics Letters

Volumn 69, Issue 15, 1996, Pages 2196-2198

  Vazquez F ^a   Kobayashi, D ^a   Kobayashi, I ^a   Miyamoto, Y ^a   Furuya, K ^a   Maruyama, T ^a   Watanabe, M ^a   Asada, M ^a  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0040564999     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.117163     Document Type: Article

References (9)

1. Hot Carriers in Semiconductor Nanostructures: Physics and Applications, edited by J. Shah (Academic, San Diego, 1992).
2. M. Heiblum and M. V. Fischetti, IBM J. Res. Dev. 34, 4 (1990).
3. F. Vázquez, D. Kobayashi, and K. Furuya, J. Appl. Phys. 79, 651 (1996).
4. F. Vázquez, D. Kobayashi, and K. Furuya, Jpn. J. Appl. Phys. 35, 2B (1996).
5. F. Vázquez, D. Kobayashi, and K. Furuya, Physica B (to be published).
6. M. Watanabe, S. Muratake, H. Fujimoto, S. Sakamori, M. Asada, and S. Arai, Jpn. J. Appl. Phys. 31, L116 (1992).
7. NanoScope II, Digital Instruments, Santa Barbara CA.
8. Model 19, Wavetek.
9. Model 5209, EG&G Instruments, Princeton Applied Research (dynamic reserve - 130 dB).