Detecting subsurface hot electrons with a scanning probe microscope

Journal of Applied Physics

Volumn 79, Issue 2, 1996, Pages 651-655

  Vazquez F ^a   Furuya, K ^a   Kobayashi, D ^a  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0039379925     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.360808     Document Type: Article

References (20)

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