Analyzing mutual inductance measurements to determine the London penetration depth

Journal of Applied Physics

Volumn 87, Issue 9 I, 2000, Pages 4344-4351

  Coffey, Mark W ^a  

^a UNIVERSITY OF COLORADO   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0040564540     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.373076     Document Type: Article

References (11)

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