Optimizing the two-coil mutual inductance measurement of the superconducting penetration depth in thin films

Journal of Applied Physics

Volumn 82, Issue 6, 1997, Pages 3028-3034

  Claassen, J H ^a   Wilson, M L ^b   Byers, J M ^a   Adrian, S ^a  

^a NAVAL RESEARCH LABORATORY   (United States)

^b CLEMSON UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CALCULATIONS; CALIBRATION; ELECTRIC COILS; ELECTRIC CONDUCTIVITY MEASUREMENT; MATHEMATICAL MODELS; OPTIMIZATION; SENSITIVITY ANALYSIS; SUPERCONDUCTING FILMS; THIN FILMS;

MUTUAL INDUCTANCE; SUPERCONDUCTING PENETRATION DEPTH;

INDUCTANCE MEASUREMENT;

EID: 0031221913     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.366287     Document Type: Article

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