Measurement of the absolute linearity of photodetectors with a diode laser

Measurement Science and Technology

Volumn 10, Issue 11, 1999, Pages 1075-1078

  Haapalinna, Atte ^a   Kübarsepp, Toomas ^a   Kärhä, Petrl ^a   Ikonen, Erkki ^a  

^a AALTO UNIVERSITY   (Finland)

Author keywords

Nonlinearity; Photodetector; Photodiode; Radiometry; Silicon; Trap detector

Indexed keywords

LASER ABLATION; LASER APPLICATIONS; PHOTODETECTORS; PHOTODIODES; SEMICONDUCTING SILICON; SEMICONDUCTOR LASERS;

BEAM ADDITION TECHNIQUES; TRAP DETECTORS;

RADIOMETRY;

EID: 0040218674     PISSN: 09570233     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-0233/10/11/317     Document Type: Article

References (8)

1. Boivin L P 1993 Automated absolute and relative spectral linearity measurements on photovoltaic detectors Metrologia 30 355-60
2. Fischer J and Fu L 1993 Photodiode nonlinearity measurement with an intensity stabilized laser as a radiation source Appl. Opt. 32 4187-90
3. Kübarsepp T, Haapalinna A, Kärhä P and Ikonen E 1998 Nonlinearity measurements of silicon photodetectors Appl. Opt. 37 2716-22
4. Köhler R, Pello R and Bonhoure J 1990 Temperature dependent nonlinearity effects of a QED-200 detector in the visible Appl. Opt. 29 4212-15
5. Budde W 1983 Optical radiation measurements Physical Detectors of Optical Radiation vol 4 (New York: Academic) pp 247-61
6. Metsälä S Finnish Patents 96149 (1996) and 102224 (1998) Patentti-ja reksiterihallitus, Helsinki, Finland
7. Stock K, Morozova S, Liedquist L and Hofer H 1998 Nonlinearity of the quantum efficiency of Si reflection trap detectors at 633 nm Metrologia 35 451-4
8. Goebel R and Stock M 1998 Nonlinearity and polarization effects in silicon trap detectors Metrologia 35 413-8