Nonlinearity of the quantum efficiency of Si reflection trap detectors at 633 nm

Metrologia

Volumn 35, Issue 4, 1998, Pages 451-454

  Stock, K D ^a   Morozova, S ^b   Liedquist, L ^c   Hofer, H ^a  

^a PHYSIKALISCH TECHNISCHE BUNDESANSTALT   (Germany)

^b ALL RUSSIA RESEARCH INSTITUTE OF OPTOPHYSICAL MEASUREMENTS VNIIOFI   (Russian Federation)

^c SP TECHNICAL RESEARCH INSTITUTE OF SWEDEN   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001639670     PISSN: 00261394     EISSN: None     Source Type: Journal    
DOI: 10.1088/0026-1394/35/4/41     Document Type: Article

References (20)

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