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Volumn 53, Issue 8, 1999, Pages 893-901

Errors and artifacts in time-resolved step-scan FT-IR spectroscopy

Author keywords

[No Author keywords available]

Indexed keywords

ERROR ANALYSIS; INFRARED RADIATION; INTERFEROMETERS; LASER PULSES; LIGHT ABSORPTION; LIGHT INTERFERENCE; MEASUREMENT ERRORS; MIRRORS; THERMAL EFFECTS;

EID: 0040166422     PISSN: 00037028     EISSN: None     Source Type: Journal    
DOI: 10.1366/0003702991947595     Document Type: Article
Times cited : (37)

References (19)
  • 5
    • 0345663628 scopus 로고    scopus 로고
    • Nanosecond Step-Scan FT-Infrared Absorption Spectroscopy in Photochemistry and Catalysis
    • J. de Haseth, Ed. American Institute of Physics, Woodbury, New York
    • H. Frei, "Nanosecond Step-Scan FT-Infrared Absorption Spectroscopy in Photochemistry and Catalysis", in Fourier-Transform Spectroscopy: Eleventh International Conference, J. de Haseth, Ed. (American Institute of Physics, Woodbury, New York, 1998), p. 28.
    • (1998) Fourier-Transform Spectroscopy: Eleventh International Conference , pp. 28
    • Frei, H.1
  • 14
    • 0002338781 scopus 로고    scopus 로고
    • Improvements in Signal Acquisition and Processing for Time-Resolved Step-Scan FTIR Spectroscopy
    • J. de Haseth, Ed. American Institute of Physics, Woodbury, New York
    • C. Rödig and F. Siebert, "Improvements in Signal Acquisition and Processing for Time-Resolved Step-Scan FTIR Spectroscopy", in Fourier-Transform Spectroscopy: Eleventh International Conference, J. de Haseth, Ed. (American Institute of Physics, Woodbury, New York, 1998), p. 388.
    • (1998) Fourier-Transform Spectroscopy: Eleventh International Conference , pp. 388
    • Rödig, C.1    Siebert, F.2
  • 17
    • 85038055553 scopus 로고    scopus 로고
    • U.S. Patent 4927269 (1990)
    • A. Keens and A. Simon, U.S. Patent 4927269 (1990).
    • Keens, A.1    Simon, A.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.