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Volumn 90, Issue 5, 2001, Pages 2370-2379

Electric-field-affect thermoelectrics

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EID: 0040028983     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1389074     Document Type: Article
Times cited : (25)

References (24)
  • 9
    • 0040151697 scopus 로고    scopus 로고
    • note
    • It should be emphasized that due to the large dielectric permittivity of PbTe and similar semiconductors, the trapping levels are extremely shallow, so that one can safely disregard their presence. The absence of trapping is an important factor for a considerably large EFE.
  • 14
    • 0033706086 scopus 로고    scopus 로고
    • A. V. Butenko, Dm. Shvarts, V. Sandomirsky, and Y. Schlesinger, Physica B 284-288, 1942 (2000); A. V. Butenko, Dm. Shvarts, V. Sandomirsky, and Y. Schlesinger, Appl. Phys. Lett. 75, 1628 (1999); A. V. Butenko, Dm. Shvarts, V. Sandomirsky, Y. Schlesinger, and R. Rosenbaum. J. Appl. Phys. 88, 2634 (2000).
    • (2000) Physica B , vol.284-288 , pp. 1942
    • Butenko, A.V.1    Shvarts, Dm.2    Sandomirsky, V.3    Schlesinger, Y.4
  • 15
    • 0038967525 scopus 로고    scopus 로고
    • A. V. Butenko, Dm. Shvarts, V. Sandomirsky, and Y. Schlesinger, Physica B 284-288, 1942 (2000); A. V. Butenko, Dm. Shvarts, V. Sandomirsky, and Y. Schlesinger, Appl. Phys. Lett. 75, 1628 (1999); A. V. Butenko, Dm. Shvarts, V. Sandomirsky, Y. Schlesinger, and R. Rosenbaum. J. Appl. Phys. 88, 2634 (2000).
    • (1999) Appl. Phys. Lett. , vol.75 , pp. 1628
    • Butenko, A.V.1    Shvarts, Dm.2    Sandomirsky, V.3    Schlesinger, Y.4
  • 16
    • 0038967526 scopus 로고    scopus 로고
    • A. V. Butenko, Dm. Shvarts, V. Sandomirsky, and Y. Schlesinger, Physica B 284-288, 1942 (2000); A. V. Butenko, Dm. Shvarts, V. Sandomirsky, and Y. Schlesinger, Appl. Phys. Lett. 75, 1628 (1999); A. V. Butenko, Dm. Shvarts, V. Sandomirsky, Y. Schlesinger, and R. Rosenbaum. J. Appl. Phys. 88, 2634 (2000).
    • (2000) J. Appl. Phys. , vol.88 , pp. 2634
    • Butenko, A.V.1    Shvarts, Dm.2    Sandomirsky, V.3    Schlesinger, Y.4    Rosenbaum, R.5
  • 18
    • 0038967527 scopus 로고    scopus 로고
    • note
    • It is clear that in realistic circumstances carrier scattering by optical phonons or other scattering processes should be also taken into account. The formalism presented here allows us to consider any scattering mechanism. However, the present calculations are for an illustrative purpose only, thus simplifying conditions are assumed.
  • 19
    • 0038967505 scopus 로고    scopus 로고
    • Thermoelectric devices
    • Wiley-VCH, Weinheim
    • D. T. Morelli, Thermoelectric Devices, Encyclopedia of Applied Physics Vol. 21 (Wiley-VCH, Weinheim, 1997), p. 339.
    • (1997) Encyclopedia of Applied Physics , vol.21 , pp. 339
    • Morelli, D.T.1
  • 20
    • 0040745862 scopus 로고    scopus 로고
    • note
    • 4 There, the carrier concentration and their mobility, which serve as the decisive factors, are largely determined by the temperature. On the other hand, at EFE doping the carrier concentration is determined by the electrical displacement D, and not by the temperature. Actually, the carrier concentrations of the uncharged intrinsic layer and the same layer when charged, at the same T, differ by several orders of magnitude. The temperature determines other properties, e.g., the dielectric constant. Thus, the optimal values of M in the chemically doped and in the EFE-doped samples may differ and be located at different T. In the present illustrative analysis we consider a simplified model of PbTe (in particular, we do not take into account the T dependence of mobility), and we also do not carry out the full optimization over T, D. and L.
  • 21
    • 0038967516 scopus 로고    scopus 로고
    • Thermoelectric materials 1998-the next generation materials for small-scale refrigeration and power generation applications
    • edited by T. M. Tritt, H. B. Lyon, Jr., G. Mahan, and M. G. Kanatzidis, Materials Research Society, Pittsburgh
    • Z. M. Dashevsky, A. Horowitz, S. Shusterman, and M. P. Dariel, in Thermoelectric Materials 1998-The Next Generation Materials for Small-Scale Refrigeration and Power Generation Applications, edited by T. M. Tritt, H. B. Lyon, Jr., G. Mahan, and M. G. Kanatzidis, MRS Symposia Proceedings No. 545 (Materials Research Society, Pittsburgh, 1999).
    • (1999) MRS Symposia Proceedings No. 545 , vol.545
    • Dashevsky, Z.M.1    Horowitz, A.2    Shusterman, S.3    Dariel, M.P.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.