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Volumn 108-109, Issue , 1998, Pages 177-181

Effects of ionization power on ion energy distribution in ionized r.f. sputtering measured by an energy-resolved mass spectrometer

Author keywords

Energy distribution analysis; Inductive r.f. plasma; Ionized PVD; Titanium

Indexed keywords

CATHODES; IONIZATION OF SOLIDS; MASS SPECTROMETRY; PLASMA APPLICATIONS; SPUTTER DEPOSITION; VAPOR DEPOSITION;

EID: 0039774304     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0257-8972(98)00650-1     Document Type: Article
Times cited : (14)

References (7)
  • 5
    • 0040633531 scopus 로고
    • in: S.M. Rossnagel, J.J. Cuomo, W.D. Westwood (Eds.), Noyes, NJ
    • D.M. Mattox, Handbook of Plasma Processing Technology, in: S.M. Rossnagel, J.J. Cuomo, W.D. Westwood (Eds.), Noyes, NJ, 1990, p. 344.
    • (1990) Handbook of Plasma Processing Technology , pp. 344
    • Mattox, D.M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.