Si(001) surface variation with annealing in ambient

Physical Review B - Condensed Matter and Materials Physics

Volumn 58, Issue 3, 1998, Pages 1385-1391

  Komeda, T ^a   Kumagai, Y ^a  

^a Texas Instruments Japan Ltd   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0039439270     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.58.1385     Document Type: Article

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