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Volumn 79, Issue 21, 2001, Pages 3458-3460
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Bulk stress due to surface damage of crystalline silicon and germanium
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0039436343
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1418268 Document Type: Article |
Times cited : (5)
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References (18)
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