-
1
-
-
21544440361
-
-
E. Spiller, Soft X-Ray Optics (SPIE Optical Engineering, Bellingham, WA, 1994).
-
E. Spiller, Soft X-Ray Optics (SPIE Optical Engineering, Bellingham, WA, 1994).
-
-
-
-
2
-
-
0027585846
-
-
V. V. Kondratenko, Yu. P. Pershin, O. V. Poltseva, A. I. Fedorenko, E. N. Zubarev, S. A. Yulin, I. V. Kozhevnikov, S. I. Sagitov, V. A. Chirkov, V. E. Levashov, and A. V. Vinogradov, Appl. Opt. AIP 32, 1811 (1993).
-
(1993)
Appl. Opt. AIP
, vol.32
, pp. 1811
-
-
Kondratenko, V.V.1
Pershin Yu., P.2
Poltseva, O.V.3
Fedorenko, A.I.4
Zubarev, E.N.5
Yulin, S.A.6
Kozhevnikov, I.V.7
Sagitov, S.I.8
Chirkov, V.A.9
Levashov, V.E.10
Vinogradov, A.V.11
-
3
-
-
0028527084
-
-
U. Kleineberg, H.-J. Stock, A. Kloidt, B. Schmiedeskamp, U. Heinzmann, S. Hopfe, and R. Scholz, Phys. Status Solidi A INS 145, 539 (1994).
-
(1994)
Phys. Status Solidi a INS
, vol.145
, pp. 539
-
-
Kleineberg, U.1
Stock, H.-J.2
Kloidt, A.3
Schmiedeskamp, B.4
Heinzmann, U.5
Hopfe, S.6
Scholz, R.7
-
4
-
-
0028444986
-
-
R. Schlatmann, C. Lu, J. Verhoeven, E. J. Puik, and M. J. van der Wiel, Appl. Surf. Sci. INS 78, 147 (1994).
-
(1994)
Appl. Surf. Sci. INS
, vol.78
, pp. 147
-
-
Schlatmann, R.1
Lu, C.2
Verhoeven, J.3
Puik, E.J.4
Van Der Wiel, M.J.5
-
5
-
-
0022241237
-
-
M. P. Bruijn, P. Chakraborty, H. W. van Essen, J. Verhoeven, M. J.van der Wiel, and W. J. Bartels, Proc. SPIE 563, 182 (1985).
-
M. P. Bruijn, P. Chakraborty, H. W. van Essen, J. Verhoeven, M. J.van der Wiel, and W. J. Bartels, Proc. SPIE 563, 182 (1985).
-
-
-
-
6
-
-
21544448549
-
-
The TEM photograph represents a projection of the absorber and spacer densities along the electron beam direction. Waviness of the thin cross-section sample will cause the absorber layers to appear thicker, and the spacer layer to appear thinner than they really are. Thus, the abruptness of the interfaces may also seem larger than it is in reality.
-
The TEM photograph represents a projection of the absorber and spacer densities along the electron beam direction. Waviness of the thin cross-section sample will cause the absorber layers to appear thicker, and the spacer layer to appear thinner than they really are. Thus, the abruptness of the interfaces may also seem larger than it is in reality.
-
-
-
-
7
-
-
21544453259
-
-
W.-K. Chu, J. W. Mayer, and M.-A. Nicolet, Backscattering Spectrometry (Academic, New York, 1978).
-
W.-K. Chu, J. W. Mayer, and M.-A. Nicolet, Backscattering Spectrometry (Academic, New York, 1978).
-
-
-
-
8
-
-
0012769165
-
-
R. Schlattmann, A. Keppel, Y. Xue, and J. Verhoeven, Appl. Phys. Lett. AIP 63, 3297 (1993).
-
(1993)
Appl. Phys. Lett. AIP
, vol.63
, pp. 3297
-
-
Schlattmann, R.1
Keppel, A.2
Xue, Y.3
Verhoeven, J.4
-
9
-
-
21544457151
-
-
O. B. Loopstra, W. G. Sloof, Th. H. de Keijser, E. Mittemeijer, S. Radelaar, A. E. T. Kuiper, and R. A. M. Wolters, J. Appl. Phys. AIP 63, 4960 (1988).
-
(1988)
J. Appl. Phys. AIP
, vol.63
, pp. 4960
-
-
Loopstra, O.B.1
Sloof, W.G.2
De Keijser, Th.H.3
Mittemeijer, E.4
Radelaar, S.5
Kuiper, A.E.T.6
Wolters, R.A.M.7
-
11
-
-
21544447776
-
-
J. F. Ziegler, J. P. Biersack, and U. Littmark, The Stopping and Range of Ions in Solids (Pergamon, New York, 1985).
-
J. F. Ziegler, J. P. Biersack, and U. Littmark, The Stopping and Range of Ions in Solids (Pergamon, New York, 1985).
-
-
-
-
14
-
-
0025488715
-
-
Y.-T. Cheng, Mater. Sci. Rep. 5, 45 (1990).
-
Y.-T. Cheng, Mater. Sci. Rep. 5, 45 (1990).
-
-
-
|