Effect of extended defects on the formation and dissociation kinetics of Zn-H complexes in heteroepitaxial p-type InP layers

Applied Physics Letters

Volumn 69, Issue 6, 1996, Pages 839-841

  Chatterjee, B ^a   Ringel, S A ^a  

^a The Ohio State University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0038995537     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.117909     Document Type: Article

References (13)

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